It discusses the architecture of testbench in functional verification of dtv chip and detailed accounts realization of memory bist ( build in self test ) method 本章介紹了各種主流驗(yàn)證測(cè)試方法,著重?cái)⑹隽薲tv芯片中功能驗(yàn)證的平臺(tái)結(jié)構(gòu)設(shè)計(jì)和存儲(chǔ)器內(nèi)建式自測(cè)試( bist )的具體實(shí)現(xiàn)。